中国科学 信息科学
  ISSN:1674-7267
CN:11-5846/TP
   首页 |  期刊介绍 |  主编寄语 |  会议信息 |  编委会 |  理事会 |  投稿指南 |  期刊订阅 |  广告合作 |  下载中心 |  留言板 |  联系我们 |  English Version
在线办公系统
文章快速检索 高级检索
欢迎访问中国科学F辑:信息科学
 · 作者投稿系统
 · 专家审稿系统
 · 编委审稿系统
 · 远程编辑系统
 · 主编审稿系统
在 线 期 刊
 · 最新录用
 · 热点文章
 · 当期目次
 · 过刊浏览
 · 作者索引
 · 高级检索
 · 全年目录
 · 按栏目浏览
 · 摘要点击排行
 · 全文下载排行
 · Email Alert
 ·
其他刊物
 · 杂志社首页
 · 科学通报
 · 中国科学 数学
 · 中国科学 化学
 · 中国科学 生命科学
 · 中国科学 地球科学
 · 中国科学 技术科学
 · 中国科学 信息科学
 · 中国科学 物理学力学天文学
 
[an error occurred while processing this directive]
Science China Information Sciences
Special Issue on Advanced Microelectronics Technologies
 
Call for Papers
Driven by the ever-increasing market demands in computing, communication, and multimedia applications, the microelectronics industry has got rapid development recently. Because of the innovations and advances at almost every technological level, such as material, process, equipment, device, circuit and system, silicon-based logic and memory IC technologies continue to be the industry’s R&D focus with the addition of nano-scaled scaling. This gives a strong boost to the traditional “Moore’s Law”, which keeps on increasing the function density while reducing the cost per function in an IC, and bring the R&D activities to a new level known as “More Moore”. At the same time, a new trend in microelectronic industry, namely “More than Moore”, has expanded the scope of IC applications by integrating non-digital functionalities into traditional CMOS micro-systems, thus enabling the deployment of innovative product solutions required by modern information world.
This special is devoted to cover the advances in state-of-the-art development, grand challenges, innovative solutions, and broad scope of microelectronic technologies related to both “More Moore” and “More than Moore”. Papers are solicited in, but not limited to the following main topics:
1. Silicon/Germanium/III-V IC devices
2. Advanced process technologies
3. Advanced and emerging memories
4. SOC/SIP design and integration
5. Analog/RF/power integrated circuits
6. Device and interconnect reliability
7. Modeling and simulation
8. Semiconductor materials and material characterization
9. Sensors, MEMS and NEMS
 
Information for Authors
Prospective authors should prepare their manuscripts in accordance with the format requirement for Science China Information Sciences and submit the PDF version of the completed manuscripts online according to the instructions given at http://info.SciChina.com.
 
Important Dates:
Manuscript submission deadline:
July 20, 2010
Acceptance notification:
September 10, 2010
Final manuscript due:
October 10, 2010
Publication day:
Early 2011
 
 
 
Guest Editor
Ru Huang <ruhuang@pku.edu.cn>, Peking University, China
Bin Zhao <bin.zhao@freescale.com>, Freescale Semiconductor, USA

欢迎访问中国科学F辑:信息科学
Network manager:010 6401 5905 Email:sys@scichina.org
© 2007 SciChina Group Copyright 2007
Science in China Press